HI-REL STX SCREENING

        

                                         MIL-S-19500
                             HI-RELIABILITY SCREENING

SEMITRONICS HI-REL DEVICES ARE AVAILABLE TESTED TO THE STANDARD STX/STXV/STS FLOWS DESCRIBED BELOW OR TO YOUR CUSTOM REQUIREMENTS USING INDUSTRY STANDARD TESTS AND QUALITY ASSURANCE STANDARDS. 

  HI- RELIABILITY SCREENING PROGRAM

TEST DESCRIPTION

QUALITY ASSURANCE LEVELS

STX

STXV

STS

INTERNAL VISUAL (PRE-CAP) INSPECTION

 

TEMPERATURE CYCLING

SURGE 1/

THERMAL RESPONSE 1/

CONSTANT ACCELERATION 2/

PARTICLE IMPACT NOISE DETECTION (PIND)

 

 

SERIALIZATION

 

 

INTERIM ELECTRICAL PARAMETERS 3/

HIGH TEMPERATURE REVERSE BIAS (HTRB)

INTERIM ELECTRICAL & DELTA PARAMETERS

BURN-IN

INTERIM ELECTRICAL & DELTA PARAMETERS

FINAL ELECTRICAL PARAMETER (DC-100% AC-LTPD)

HERMETIC SEAL (FINE & GROSS LEAK)

RADIOGRAPHY

 

 

EXTERNAL VISUAL EXAMINATION

 

 

1/  PERFORMED IF TEST CONDITIONS SPECIFIED IN SPECIFICATIONS

2/  PERFORMED ON GOLD BOND DEVICES ONLY

3/  FOR CASE MOUNTED ONLY

 

 

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